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Beilstein J. Nanotechnol. 2011, 2, 834–844, doi:10.3762/bjnano.2.93
Figure 1: (a) Topography (color bar: 0–70 nm), (b) phase (color bar: 0–15 degrees), (c) error signal (scale i...
Figure 2: (a) Topography (color bar: 0–70 nm), (b) phase (color bar: 0–15 degrees), (c) error signal (scale i...
Figure 3: (a) Topography (color bar: 0–15 nm), (b) phase (color bar: 0–20 degrees), (c) error signal (scale i...
Figure 4: Histogram of the normalized modulus for different illumination conditions: As prepared, at 365 nm f...
Figure 5: Displacement vectors for the normal mode that dominates the averaged force constant of (a) trans- a...
Figure 6: (a) Arrangement of the fixed sulfur atoms in the MD model of the SAM. The unit cell that has been p...
Figure 7: Compound 1 and compound 2 (2-DA-thiol), showing the deprotection reaction yielding the molecule use...
Figure 8: AFM images of (a) clean evaporated Au surface (500 × 500 nm2 color bar 12 nm) and (b) surface coate...
Figure 9: UV–vis spectra for thio-2-DA in chloroform solution after exposure to 365 nm light (cis form) and 4...
Figure 10: Sketch of the model used to derive SAM stiffness from QM results on the single molecule. (a) A is t...
Figure 11: Computational compression procedure: Force acting on the indenter as a function of the distance bet...